The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2025
Filed:
Dec. 01, 2021
Seagate Technology Llc, Fremont, CA (US);
Sha Zhu, Fremont, CA (US);
Maissarath Nassirou, Fremont, CA (US);
Cindy Ng, Fremont, CA (US);
Caiyan Lu, Campbell, CA (US);
SEAGATE TECHNOLOGY LLC, Fremont, CA (US);
Abstract
Methods for analysis of the magnetic grain using a software program effectively and accurately by improving the magnetic grain boundary contrast from an image prior to analyzing the grain size with an imaging analysis program. A method for automated grain size analysis includes obtaining a SEM electronic image of a magnetic material composed of a plurality of grains and modifying the image by smoothing the image, removing high spatial and low spatial frequencies from the image, improving contrast of the image, pixelating the image, processing the image to a binary image, and clearing outer edges of the binary image to remove at least incomplete grains to generate grain size data from the image.