The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2025
Filed:
Sep. 16, 2021
Applicant:
Doosan Enerbility Co., Ltd, Changwon, KR;
Inventors:
Jung Min Lee, Seoul, KR;
Jung Moon Kim, Seongnam, KR;
Assignee:
DOOSAN ENERBILITY CO., LTD., Changwon, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 3/00 (2024.01); G06T 5/40 (2006.01); G06T 5/50 (2006.01); G06T 5/70 (2024.01); G06T 7/00 (2017.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G06T 3/00 (2013.01); G06T 5/40 (2013.01); G06T 5/50 (2013.01); G06T 5/70 (2024.01); G06T 11/00 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20192 (2013.01); G06T 2207/20221 (2013.01);
Abstract
A method of generating a defect image for deep learning and a system therefor are provided. The method and the system are intended to be used in generating training data for an artificial intelligence algorithm. More specifically, the training data are defect images required to train an algorithm that identifies a defect from a product.
Lee, Jung. (2025). Defect image generation method for deep learning and system therefor (U.S. Patent No. 12229932). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12229932
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