The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2025
Filed:
Oct. 07, 2021
Applicant:
Nec Laboratories America, Inc., Princeton, NJ (US);
Inventors:
Utsav Drolia, Milipitas, CA (US);
Srimat Chakradhar, Manalapan, NJ (US);
Sibendu Paul, West Lafayette, IN (US);
Assignee:
NEC Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/04 (2023.01); G06T 7/00 (2017.01); H04N 23/60 (2023.01);
U.S. Cl.
CPC ...
G06T 7/0002 (2013.01); G06N 3/04 (2013.01); H04N 23/64 (2023.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30168 (2013.01); G06T 2207/30232 (2013.01);
Abstract
Methods and systems for image filtering include detecting a distortion level of input images, using a distortion detection model that is trained using confidence values generated by a pre-trained image classifier with a set of distorted training images. An analysis is performed on input images having a detected distortion level that is lower than a threshold, with input images having an above-threshold detected distortion level being filtered out.