The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2025
Filed:
Apr. 01, 2021
Max-planck-gesellschaft Zur Foerderung Der Wissenschaften E.v., Munich, DE;
Johannes Dominik Seelig, Bonn, DE;
Ivan Vishniakou, Bonn, DE;
Abstract
A method for training a mathematical model which describes a light propagation in a reflection microscopy includes radiating a light distribution Iinto an excitation path of a microscope, modulating the light distribution Ito form a light distribution Iin the excitation path via an optical modulator, reflecting the light distribution Iat a location of a sample in a detection path of the microscope, modulating the light distribution Ito form a light distribution Iin the detection path via a further optical modulator, recording a reflected light distribution I, repeating the above steps n-fold to generate an n-fold 3-tuple (M, M; I), transferring the n-fold 3-tuple (M, M; I) to a computer to implement a mathematical model F for a light propagation in reflection microscopy, and ascertaining the mathematical model F which describes the light propagation in reflection microscopy based on the n-fold 3-tuple (M, M; I).