The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2025

Filed:

Mar. 26, 2021
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Leo Parker Dirac, Seattle, WA (US);

Aleksandr Mikhaylovich Ingerman, Seattle, WA (US);

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01);
Abstract

At a machine learning service, a determination is made that an analysis to detect whether at least a portion of contents of one or more observation records of a first data set are duplicated in a second set of observation records is to be performed. A duplication metric is obtained, indicative of a non-zero probability that one or more observation records of the second set are duplicates of respective observation records of the first set. In response to determining that the duplication metric meets a threshold criterion, one or more responsive actions are initiated, such as the transmission of a notification to a client of the service.


Find Patent Forward Citations

Loading…