The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2025

Filed:

Nov. 15, 2022
Applicant:

Asustek Computer Inc., Taipei, TW;

Inventors:

Chin-Hao Yeh, Taipei, TW;

Chin-Wen Lin, Taipei, TW;

Hung-Yi Lin, Taipei, TW;

Assignee:

ASUSTeK COMPUTER INC., Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 7/14 (2006.01); G06K 19/06 (2006.01);
U.S. Cl.
CPC ...
G06K 7/1417 (2013.01); G06K 7/1443 (2013.01); G06K 7/146 (2013.01); G06K 19/06037 (2013.01);
Abstract

A reading method and a reading device for a two-dimensional code. The method includes: capturing a two-dimensional code image through an image capturing device; detecting an outer frame and a position mark of a two-dimensional code in a skewed state in the two-dimensional code image; restoring the two-dimensional code in the skewed state to a default state; and performing a default operation according to the two-dimensional code in the default state.


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Yeh, Chin-Hao. (2025). Reading method and reading device for two-dimensional code (U.S. Patent No. 12229630). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12229630

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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