The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2025
Filed:
Sep. 27, 2023
Gen-probe Incorporated, San Diego, CA (US);
Norbert D. Hagen, Carlsbad, CA (US);
David Opalsky, San Diego, CA (US);
Rolf Silbert, Del Mar, CA (US);
GEN-PROBE INCORPORATED, San Diego, CA (US);
Abstract
A method of reading machine-readable labels on sample receptacles. In the method, a sample rack is moved between a first position and a second position within a housing, where the sample rack supports a plurality of sample receptacles, and each sample receptacle has a machine-readable label. An absolute position of the sample rack is measured as the sample rack moves between the first and second positions. An image of the machine-readable label associated with each sample receptacle is acquired as the sample rack moves between the first and second positions. Finally, the acquired image of each machine-readable label is decoded.