The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2025
Filed:
Oct. 12, 2022
Gitlab Inc., San Francisco, CA (US);
Julian Thome, Esch/Alzette, DE;
James Johnson, Sammamish, WA (US);
Isaac Dawson, Yokohama, JP;
Dinesh Bolkensteyn, San Francisco, CA (US);
Michael Henriksen, San Francisco, CA (US);
Mark Art, Mosman, AU;
GitLab Inc., San Francisco, CA (US);
Abstract
A method or system for testing and benchmarking commits made on source code. The system extracts commits from a history of a first code history that records a sequence of commits made thereon. The extracted commits are then combined into a sequence of patches, each of which includes changes made during consecutive commits. The system also establishes a connection with a system under test (SUT) having a second code repository corresponding to a historical version of the first code repository before the extracted commits were made, and sequentially applies the sequence of the patches to the second code repository. Performance of the SUT is monitored during the application of the sequence of the patches to determine whether the SUT performs as expected after the application of each patch.