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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12229485 B1

PDFFull Text
Date of Patent:
Feb. 18, 2025

Filed:

Dec. 01, 2021

Assist apparatus, design assist method, design assist system, and computer readable medium

Applicant:

Asahi Kasei Microdevices Corporation, Tokyo, JP;

Inventors:

Takaya Higa, Tokyo, JP;

Taisuke Fujita, Tokyo, JP;

Assignee:

Asahi Kasei Microdevices Corporation, Tokyo, JP;

Attorneys:

William H. Bollman

WILLIAM BOLLMAN

OURMAZD OJAN

DANIEL H SHERR

GEORGE MORGAN

LINDA SALTIEL

Primary Examiner:

Stacy Whitmore

Int. Cl.
CPC ...
G06F 30/337 (2020.01); G06F 30/33 (2020.01); G06F 119/08 (2020.01);
U.S. Cl.
CPC ...
G06F 30/337 (2020.01); G06F 30/33 (2020.01); G06F 2119/08 (2020.01);
Abstract

There is provided a design assist apparatus including an inputting unit configured to input an analysis condition including substrate information of a thermal analysis target and current detection element information, and a display control unit configured to control a display unit to display, on the display unit, a thermal analysis result based on the analysis condition, in which the display control unit is configured to control the display unit to display, on the display unit and in a mutually identifiable manner, a first thermal analysis result based on a first analysis condition input by the inputting unit and a second thermal analysis result based on a second analysis condition obtained by changing at least one of the substrate information and the current detection element information from the first analysis condition.

Find Patent Forward Citations

Higa, Takaya. (2025). Assist apparatus, design assist method, design assist system, and computer readable medium (U.S. Patent No. 12229485). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12229485

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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