The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2025

Filed:

Aug. 19, 2022
Applicant:

Sap SE, Walldorf, DE;

Inventors:

Wei Chen, Shanghai, CN;

Wenbing Duan, Shanghai, CN;

Xudong Liu, Shanghai, CN;

Tianhao Liu, Shanghai, CN;

Xiang Fan, Shanghai, CN;

Jia Wang, Shanghai, CN;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3636 (2013.01); G06F 11/3624 (2013.01); G06F 11/3692 (2013.01);
Abstract

Computer-readable media, methods, and systems are disclosed for automatic generation of dynamic application trace logs associated with a running application. A log viewer presents application log entries associated with an application execution log having been generated in connection with a previous execution of the running application. The application execution log is analyzed to identify application execution log context descriptors. The application execution log context descriptors are extracted from the application execution log. The application execution log context descriptors are transmitted to the running application. Matching templates that match each of the one or more application execution log context descriptors are received from the running application. The tracing templates that have an associated context relevance score are received from the running application. Finally, the log viewer displays the tracing templates based on the associated context relevance score and starts a trace based on a selected tracing template.


Find Patent Forward Citations

Chen, Wei. (2025). On-demand contextual trace log generation (U.S. Patent No. 12229039). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12229039

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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