The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2025

Filed:

Apr. 14, 2020
Applicant:

Blancco Technology Group Ip Oy, Joensuu, FI;

Inventor:

Mikko Fabritius, Joensuu, FI;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06F 11/22 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0769 (2013.01); G06F 11/0748 (2013.01); G06F 11/2294 (2013.01); G06F 11/3452 (2013.01); G06F 11/3495 (2013.01); G06F 11/0787 (2013.01);
Abstract

According to an aspect, there is provided a method for guiding a user in diagnostic test selection. Initially, one or more diagnostic reports on each of a plurality of computing devices are maintained in a diagnostic report database. In response to receiving a first set of one or more device parameters characterizing a second computing device from a first computing device, a remote computing system compares the first set to a plurality of sets of device parameters maintained in the diagnostic report database to find one or more relevant diagnostic reports. The remote computing system predicts results of one or more diagnostic tests when performed on the second computing device based on results of one or more diagnostic tests in the one or more relevant diagnostic reports by using statistical analysis. The remote computing system sends results of the predicting to the first computing device.


Find Patent Forward Citations

Fabritius, Mikko. (2025). Diagnostic test prioritization based on accumulated diagnostic reports (U.S. Patent No. 12228998). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12228998

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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