The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2025

Filed:

Aug. 27, 2019
Applicant:

Leica Microsystems Cms Gmbh, Wetzlar, DE;

Inventors:

Christian Schumann, Lich, DE;

Christian Schulz, Huettenberg, DE;

Arnold Mueller-Rentz, Brechen, DE;

Andreas Lotter, Braunfels, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/18 (2006.01); G02B 21/04 (2006.01); G02B 21/33 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G02B 21/18 (2013.01); G02B 21/04 (2013.01); G02B 21/33 (2013.01); G02B 21/361 (2013.01);
Abstract

An optical imaging device for a microscope includes an objective and an optical system configured to interact with the objective for optically imaging an object selectively in a first operating mode and a second operating mode. The optical system includes a first optical subsystem associated with the first operating mode, and a second optical subsystem associated with the second operating mode. The first optical subsystem is configured to form a first image of the object with a first magnification. The second optical subsystem is configured to form a second image of the object with a second magnification that is less than the first magnification. The second optical subsystem includes an optical module insertable into the optical path for selecting the second operating mode. The optical module includes a lens element with a positive refractive power.


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