The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2025

Filed:

Mar. 15, 2023
Applicants:

National Taiwan University, Taipei, TW;

Yonglin Healthcare Foundation, New Taipei, TW;

Inventors:

Yuan Luo, New Taipei, TW;

Yu-Hsuan Chuang, New Taipei, TW;

Yu-Zi Lin, New Taipei, TW;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 21/06 (2006.01); G02B 21/14 (2006.01); G02B 21/34 (2006.01);
U.S. Cl.
CPC ...
G02B 21/14 (2013.01); G02B 21/0052 (2013.01); G02B 21/34 (2013.01);
Abstract

A system for quantitative differential phase contrast microscopy with isotropic transfer function utilizes a modulation mechanism to create a detection light field having a radial or other axial orientation of optical intensity gradient or other distribution. A condenser generates an off-axis light field to project onto an object under examination, thereby generating an object light field, which is then guided to an image capturing device through an objective lens for capturing images. A differential phase contrast algorithm is applied to the images for obtaining a phase, thereby a depth information corresponding to the phase can be obtained to reconstruct the surface profile of the object.


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