The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2025

Filed:

Nov. 09, 2021
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Takao Taguchi, Minamiashigara, JP;

Yukito Saitoh, Minamiashigara, JP;

Hiroshi Sato, Minamiashigara, JP;

Katsumi Sasata, Minamiashigara, JP;

Akiko Watano, Minamiashigara, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 17/08 (2006.01); G02B 1/08 (2006.01); G02B 5/20 (2006.01); G02B 5/30 (2006.01); G02F 1/1335 (2006.01); G02F 1/137 (2006.01);
U.S. Cl.
CPC ...
G01S 17/08 (2013.01); G02B 1/08 (2013.01); G02B 5/3016 (2013.01); G02F 1/133543 (2021.01); G02F 1/13718 (2013.01); G02B 5/20 (2013.01); G02F 2201/343 (2013.01);
Abstract

Provided is a sensor having a high SN ratio. The sensor includes a light source, a band pass filter; and a light-receiving element, in which the band pass filter includes a cholesteric liquid crystal layer that is a layer obtained by immobilizing a cholesteric liquid crystalline phase, the cholesteric liquid crystal layer has a region where a refractive index nx in an in-plane slow axis direction and a refractive index ny in an in-plane fast axis direction satisfy nx>ny, and in a case where a selective reflection wavelength of the cholesteric liquid crystal layer is represented by λ, the cholesteric liquid crystal layer has a second selective reflection peak at a wavelength λ/and a half-width of the second selective reflection peak at λ/2 is 30 nm or less.


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