The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2025

Filed:

Nov. 06, 2020
Applicant:

Zf Friedrichshafen Ag, Friedrichshafen, DE;

Inventors:

Martin Ruchti, Langenargen, DE;

Thomas Nägele, Friedrichshafen, DE;

Stefan Rinkenauer, Markdorf, DE;

Jens Klimke, Friedrichshafen, DE;

Tobias Moers, Friedrichshafen, DE;

Dominik Raudszus, Friedrichshafen, DE;

Hendrik Weber, Friedrichshafen, DE;

Maike Scholtes, Friedrichshafen, DE;

Lutz Eckstein, Aachen, DE;

Assignee:

ZF Friedrichshafen AG, Friedrichshafen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/931 (2020.01); G01S 13/86 (2006.01);
U.S. Cl.
CPC ...
G01S 13/931 (2013.01); G01S 13/865 (2013.01); G01S 13/867 (2013.01);
Abstract

A method for obtaining approval of a sensor system for detecting objects in a vehicle's environment includes providing a combined probability distribution for deviations between output data from a sensor system and reference data at the programming level for detecting objects by the sensor system, at the sensor level and/or at the fusion level, sampling deviation combinations and calculating occurrence probabilities for the sampled deviation combinations using the combined probability distribution, subjecting the reference data to the sampled deviation combinations, processing these reference data with a fusion unit, and obtaining fusion results, removing occurrence probabilities from the combined probability distribution from which those fusion results are obtained that satisfy a predefined condition, and obtaining a residual probability distribution, taking the integral of the residual probability distribution and obtaining an absolute error probability, and obtaining approval of the sensor system based on the absolute error probability.


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