The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2025
Filed:
Dec. 30, 2022
Siemens Healthcare Gmbh, Erlangen, DE;
David Grodzki, Erlangen, DE;
Siemens Healthineers AG, Erlangen, DE;
Abstract
In a method to improved positioning of slices in which measurement data is to be recorded, a planning image of an examination object is provided that has been distortion-corrected using non-linearity data describing a non-linearity of a gradient unit of the magnetic resonance system, a desired field of view and desired slices in the at least one planning image are selected, a measurement protocol to record the measurement data is loaded, switchable gradients and/or emittable RF pulses are adapted, as a function of the non-linearity data that has been loaded and the desired slices, such that the desired slices are excited despite the non-linearities of the gradient unit, and the loaded measurement protocol is performed in the selected field of view, using the adapted gradients to be switched and/or adapted RF pulses. The measurement protocol may include switchable gradients and the emittable RF pulses.