The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2025

Filed:

Oct. 08, 2021
Applicant:

Wuhan University, Hubei, CN;

Inventors:

Yigang He, Hubei, CN;

Lei Wang, Hubei, CN;

Lie Li, Hubei, CN;

Yingying Zhao, Hubei, CN;

Bolun Du, Hubei, CN;

Liulu He, Hubei, CN;

Assignee:

WUHAN UNIVERSITY, Hubei, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/08 (2020.01); G06F 30/27 (2020.01); G06N 3/045 (2023.01); G06F 113/04 (2020.01);
U.S. Cl.
CPC ...
G01R 31/085 (2013.01); G01R 31/088 (2013.01); G06F 30/27 (2020.01); G06N 3/045 (2023.01); G06F 2113/04 (2020.01);
Abstract

The disclosure discloses a single-ended fault positioning method and system for a HVDC power transmission line based on a hybrid deep network. The method comprises the following: collecting rectification side bus output voltage and current signals of a HVDC power transmission system under different fault types, fault distances and transition resistances as an original data set; eliminating electromagnetic coupling of the bipolar direct-current line by using phase-mode transformation, extracting IMF components of fault voltage and current signals under different fault scenes by using variational mode decomposition, and calculating TEO of the IMF components to obtain a fault data set after feature engineering; normalizing the fault data set, and dividing the fault data set into a training set and a test set; and successively inputting the training set and the test set into a hybrid network of a convolutional neural network and a long short-term memory network for training and testing.


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