The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2025
Filed:
Jan. 14, 2020
Elta Systems Ltd., Ashdod, IL;
Benyamin Almog, Givat Brener, IL;
Nadav Oxenfeld, Ramat Raziel, IL;
ELTA SYSTEMS LTD., Ashdod, IL;
Abstract
A method and system are presented for determining properties of an electromagnetic waveform. The method comprises: providing measured parametric EM field data indicative of measured vector components of electric and magnetic fields of an EM waveform measured in at least one instance of time: providing reference data indicative of a plurality of reference data sets, each data set comprising: a reference steering vector parameters indicative of a certain respective direction of arrival (DO A), and a corresponding parametric EM field reference data including reference vector components of an electric and magnetic field pertaining to a wavefront propagating with the DO A of the corresponding reference steering vector parameters; determining a matching score between the measured parametric EM field data and the parametric EM field reference data of one or more of the reference data sets; and in case the matching score of a certain reference data set complies with a certain threshold condition, determining that said measured parametric EM field data corresponds to said EM waveform having a single EM wavefront thereby enabling to discriminate between measured EM waveforms having a single wavefront and measured EM waveforms having multiple wavefronts.