The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2025

Filed:

Mar. 25, 2021
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:

Thomas Koehler, Norderstedt, DE;

Gereon Vogtmeier, Aachen, DE;

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/041 (2018.01); G21K 1/02 (2006.01); G21K 1/06 (2006.01);
U.S. Cl.
CPC ...
G01N 23/041 (2018.02); G21K 1/025 (2013.01); G21K 1/06 (2013.01); G21K 2201/067 (2013.01); G21K 2207/005 (2013.01);
Abstract

A focusing grating device () is described comprising a substrate () and a grating comprising a plurality of grating features () positioned on the substrate (). The grating features () are positioned non-perpendicular to the substrate surface, thereby inducing a first focusing direction. The substrate () is curved, thereby inducing a second focusing direction, which is different from the first focusing direction. An X-ray system () comprising such a focusing grating device () as well as a method for producing such a focusing grating device () are also described.


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