The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2025
Filed:
Sep. 27, 2019
Applicant:
Sysmex Corporation, Kobe, JP;
Inventors:
Hiroo Tatsutani, Kobe, JP;
Motoi Kinishi, Kobe, JP;
Tomohiro Tsuji, Kobe, JP;
Yasuaki Tsuruoka, Kobe, JP;
Satoshi Yoneda, Kobe, JP;
Assignee:
SYSMEX CORPORATION, Hyogo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/10 (2006.01); G01N 15/14 (2006.01); G01N 15/1429 (2024.01);
U.S. Cl.
CPC ...
G01N 15/1012 (2013.01); G01N 15/1425 (2013.01); G01N 15/1429 (2013.01);
Abstract
Disclosed is a measurement apparatus that includes: a measurement unit configured to measure a control sample for quality control; a display unit; and a processing unit configured to cause the display unit to display an input screen for setting an evaluation criterion used in the quality control, and, in the measurement apparatus, the processing unit causes the display unit to display a quality control result of a test item, based on the evaluation criterion and a measurement result of the control sample.