The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2025
Filed:
Oct. 11, 2019
Raylase Gmbh, Wessling, DE;
Wolfgang Lehmann, Germering, DE;
RAYLASE GmbH, Wessling, DE;
Abstract
The present invention relates to a laser processing system comprising a frame structure; a work base for supporting a work material, wherein the work base defines a work field in a work plane, wherein the work plane is parallel to the work base; at least one laser device for projecting work light on the work plane and/or on the work material, when the work material is disposed on the work base, wherein the at least one laser device is attached to the frame structure; wherein each laser device is configured for generating one or more reference marks on the work material and/or on the work plane within the corresponding laser field, wherein the laser field corresponds to at least a part of the work field; an optical detector for scanning the work field for detecting at least a part of the one or more reference marks generated by each laser device, wherein the optical detector is movable with respect to the frame structure with not more than two, preferably not more than one, degree of freedom; and a control unit functionally connected to the optical detector and the at least one laser device, wherein the control unit is configured for calibrating the at least one laser device based on the reference marks detected by the optical detector. The invention further refers to a related method of calibrating one or more laser devices of a laser processing system.