The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2025

Filed:

May. 29, 2024
Applicant:

Derrick Corporation, Buffalo, NY (US);

Inventors:

James Colgrove, East Aurora, NY (US);

Zachery Walleshauser, Lancaster, NY (US);

Glenn Geles, East Aurora, NY (US);

Layne Collins, Buffalo, NY (US);

Assignee:

Derrick Corporation, Buffalo, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B07B 1/46 (2006.01); B03B 5/48 (2006.01);
U.S. Cl.
CPC ...
B07B 1/4645 (2013.01); B03B 5/48 (2013.01); B07B 2201/04 (2013.01);
Abstract

Static screening apparatuses that provide improved efficiency in the removal of undersized particles from oversized particles. In an embodiment, a static screening apparatus incorporates two or more (e.g., multiple) stacked screening modules allowing for adding additional screening capacity without significantly increasing space requirements for the multiple screening apparatuses. In some embodiments, a static screening apparatus utilizes specialized synthetic screening surfaces having an increased open area in relation to convention wire and wedge wire screens. The increased open area of such synthetic screen surfaces provides more efficient separation of oversized materials from undersized materials in sieve or static screen assemblies. In further embodiments, a stacked static screening apparatus may incorporate synthetic screening surfaces.


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