The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2025
Filed:
May. 29, 2019
Applicant:
Centrillion Technology Holdings Corporation, Grand Cayman, KY;
Inventor:
Paul Dentinger, Sunol, CA (US);
Assignee:
CENTRILLION TECHNOLOGY HOLDINGS CORPORATION, Grand Cayman, KY;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01J 19/00 (2006.01); G01N 21/21 (2006.01);
U.S. Cl.
CPC ...
B01J 19/0046 (2013.01); G01N 21/211 (2013.01); B01J 2219/00529 (2013.01); B01J 2219/00608 (2013.01); B01J 2219/00612 (2013.01); B01J 2219/00659 (2013.01); B01J 2219/00675 (2013.01); B01J 2219/00693 (2013.01); B01J 2219/00702 (2013.01); B01J 2219/00722 (2013.01);
Abstract
The present disclosure relates to method of monitoring a solid-phase reaction on a surface of a substrate by taking measurements at a plurality of positions on the surface. Properties of the surface are determined based on the measurements taken. Based on the properties determined, the extent of the solid-phase reaction is determined. This method can be achieved by using an ellipsometer and measuring the changes in thickness of the surface before and after the solid-phase reaction.