The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2025
Filed:
Mar. 19, 2020
Leica Microsystems Nc, Inc., Durham, NC (US);
Robert H. Hart, Cary, NC (US);
Dorothy M. Branco, Durham, NC (US);
Eric L. Buckland, Hickory, NC (US);
Micaela R. Mendlow, Jersey City, NJ (US);
LEICA MICROSYSTEMS NC, INC., Durham, NC (US);
Abstract
Systems for determining an apex of curvature In an image, obtained from, a sample are provided. The systems include —an imaging system configured to obtain a plurality of scans of a sample using a radial pattern; and a processor associated with the imaging system. The processor is configured to segment and curve fit each of the plurality of scans to a surface of the sample; determine an apex. for each curve associated with each of the plurality of scans; determine a true apex, among all determined apexes using a derivative of least value; calculate an XY offset based on the determined true apex; map the true apex to an origin where X and Y are equal to zero; and adjust the coordinates associated with remaining apexes not determined to be the true apex based on the calculated offset.