The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2025
Filed:
Jan. 02, 2020
Apple Inc., Cupertino, CA (US);
Yushu Zhang, Beijing, CN;
Yingzhu Zhao, Beijing, CN;
Guotong Wang, Beijing, CN;
Victor Sergeev, Nizhny Novgorod, RU;
Alexei Davydov, Nizhny Novgorod, RU;
Apple Inc., Cupertino, CA (US);
Abstract
Systems, apparatuses, methods, and computer-readable media are provided for framework of layer 1 signal-to-interference plus noise ratio (L1-SINR) measurement and reporting based on channel measurement and interference measurement. The channel measurement is performed on a first set of reference signal (RS) resources, and the interference measurement is performed on a second set of RS resources. Each of the second set of RS resources is mapped to each of the first set of RS resources. The L1-SINR is determined from a first RS resource of the first set of RS resources and a second RS resource of the send set of RS resources, where the first RS resource is mapped to the second RS resource. A message including the L1-SINR is generated and transmitted to the access node.