The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 2025

Filed:

Oct. 19, 2022
Applicant:

Abb Schweiz Ag, Baden, CH;

Inventors:

Bjarne Johansson, Västerås, SE;

Mats Rågberger, Västerås, SE;

Assignee:

ABB Schweiz AG, Baden, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H02M 7/48 (2007.01); H02M 1/00 (2007.01);
U.S. Cl.
CPC ...
H02M 7/48 (2013.01); H02M 1/0074 (2021.05);
Abstract

A method in a system is provided for handling failures in a process control system including a plurality of compute nodes. The process control system includes at least two instances of virtualized distributed control nodes, VDCNs, deployed in a respective compute node of a cluster of at least two compute nodes, wherein a first VDCN is a primary VDCN controlling an automated process and at least a second VDCN is a backup VDCN. The method includes detecting that the number of instances of the VDCNs is less than a set number and assigning the role of primary VDCN to the second VDCN. A device, computer program, computer program product and system are also disclosed.


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Johansson, Bjarne. (2025). Methods and means for failure handling in process control systems (U.S. Patent No. 12224679). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12224679

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