The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2025
Filed:
Sep. 12, 2019
The University of Hong Kong, Hong Kong, CN;
The University of Hong Kong, Hong Kong, CN;
Abstract
A method and system are provided for anomaly detection in energy systems. Non-contact sensing of an energy system based on electric and magnetic fields uses non-contact electric- and magnetic-field sensors to produce electric- and magnetic-field signals. The electric and magnetic field signals are filtered to remove noise. Features are extracted and normalized from the magnetic and electric field signals to characterize parameters of each signal. Density-based spatial clustering of extracted features is performed using a selected minimum number of points required to form a cluster and a parameter indicating the distance within which data are considered to fall within the cluster. An anomaly is determined from data point(s) that do not fall within the cluster formed by data points in normal operation. The density-based spatial clustering of extracted features may be performed using a Density-Based Spatial Clustering of Application with Noise (DBSCAN) algorithm. Features may be extracted using Fourier analysis.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile