The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2025
Filed:
Jan. 25, 2021
Mellanox Technologies, Ltd., Yokneam, IL;
Tali Septon, Haifa, IL;
Itshak Kalifa, Bat-Yam, IL;
Elad Mentovich, Tel Aviv, IL;
Matan Galanty, Korzim, IL;
Yaakov Gridish, Yoqneam Ilit, IL;
Hanan Shumacher, Kohav Yair, IL;
Vadim Balakhovski, Herzliya, IL;
Juan Jose Vegas Olmos, Solrød Strand, DK;
MELLANOX TECHNOLOGIES, LTD., Yokneam, IL;
Abstract
A method and system for analyzing Vertical-Cavity Surface-Emitting Lasers (VCSELs) on a wafer are provided. An illustrative method of is provided that includes: applying a stimulus to each of the plurality of VCSELs on the wafer; measuring, for each of the plurality of VCSELs, two or more VCSEL parameters responsive to the stimulus; correlating the measured two or more VCSEL parameters to define a value of a common performance characteristic; and identifying clusters of VCSELs having similar values of the common performance characteristic. The clusters of VCSELs may be determined to collectively meet or not meet an optical performance requirement defined for the VCSELs on the wafer.