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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12224189 B1

PDFFull Text
Date of Patent:
Feb. 11, 2025

Filed:

Dec. 29, 2021

Substrate type sensor and method of measuring the impact point and the impact force of chemical

Applicant:

Semes Co., Ltd., Cheonan-si, KR;

Inventors:

Young Seop Choi, Cheonan-si, KR;

Yong-Jun Seo, Hwaseong-si, KR;

Sang Hyun Son, Busan, KR;

Jun Gwon Lee, Ulsan, KR;

Hak Hyon Kim, Cheonan-si, KR;

Sun Yong Park, Cheonan-si, KR;

Assignee:

SEMES CO., LTD., Cheonan-si, KR;

Attorneys:

PNJ IP Law, P.C.

JINSEONG PARK

Primary Examiner:

Benjamin R Schmitt

Int. Cl.
CPC ...
H01L 21/67 (2006.01); C23C 16/02 (2006.01); C23C 16/455 (2006.01); C23C 16/52 (2006.01); G01L 5/00 (2006.01); G01L 19/08 (2006.01); G01L 19/14 (2006.01);
U.S. Cl.
CPC ...
H01L 21/67253 (2013.01); C23C 16/0227 (2013.01); C23C 16/45563 (2013.01); C23C 16/52 (2013.01); G01L 5/0052 (2013.01); G01L 19/083 (2013.01); G01L 19/086 (2013.01); G01L 19/147 (2013.01); H01L 21/67259 (2013.01);
Abstract

A substrate type sensor includes a substrate shape member, a pressure sensor panel provided at the substrate shape member, the pressure sensor panel including a plurality of pressure sensors, a central module including a transmission unit, the reception unit receiving data from the pressure sensor panel, and a battery proving power to the pressure sensor panel and the central module.

Find Patent Forward Citations

Choi, Young. (2025). Substrate type sensor and method of measuring the impact point and the impact force of chemical (U.S. Patent No. 12224189). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12224189

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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