The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 2025

Filed:

May. 07, 2020
Applicants:

Universite DE Brest, Brest, FR;

Inserm, Paris, FR;

Inventor:

Gwenolé Quellec, Brest, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/82 (2022.01); G06N 3/045 (2023.01); G06T 7/73 (2017.01); G06V 10/74 (2022.01); G06V 10/77 (2022.01);
U.S. Cl.
CPC ...
G06V 10/82 (2022.01); G06N 3/045 (2023.01); G06T 7/74 (2017.01); G06V 10/761 (2022.01); G06V 10/7715 (2022.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract

Disclosed is an automatic image analysis method that can be used to automatically recognise at least one rare characteristic in an image to be analysed. The method comprises a learning phase during which at least one convolutional neural network is trained to recognise characteristics, a parameter space of dimension n, in which n≥2, is constructed from at least one intermediate layer of the network, a presence probability function is determined for each characteristic in the parameter space from a projection of reference images in the parameter space. During a phase of analysing the image to be analysed, the method comprises a step of recognising the at least one rare characteristic in the image to be analysed on the basis of the presence probability function determined for the at least one rare characteristic.


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