The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 2025

Filed:

Aug. 10, 2022
Applicant:

Faro Technologies, Inc., Lake Mary, FL (US);

Inventors:

Matthias Wolke, Korntal-Münchingen, DE;

Jafar Amiri Parian, Schlieren, CH;

Assignee:

FARO TECHNOLOGIES, INC., Lake Mary, FL (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/33 (2017.01); G06T 7/73 (2017.01); H04N 23/698 (2023.01);
U.S. Cl.
CPC ...
G06T 7/337 (2017.01); G06T 7/74 (2017.01); G06T 2207/10024 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/10032 (2013.01); H04N 23/698 (2023.01);
Abstract

A system includes a first type of measurement device that captures first 2D images, a second type of measurement device that captures 3D scans. A 3D scan includes a point cloud and a second 2D image. The system also includes processors that register the first 2D images. The method includes accessing the 3D scan that records at least a portion of the surrounding environment that is also captured by a first 2D image. Further, 2D features in the second 2D image are detected, and 3D coordinates from the point cloud are associated to the 2D features. 2D features are also detected in the first 2D image, and matching 2D features from the first 2D image and the second 2D image are identified. A position and orientation of the first 2D image is calculated in a coordinate system of the 3D scan using the matching 2D features.


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