The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 2025

Filed:

Jul. 20, 2021
Applicant:

Meta Platforms, Inc., Menlo Park, CA (US);

Inventors:

Chien Cheng Liu, San Jose, CA (US);

Cheng-Chiang Chen, San Jose, CA (US);

Yunqing Chen, Los Altos, CA (US);

Assignee:

META PLATFORMS, INC., Menlo Park, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/11 (2017.01); G06T 3/60 (2006.01);
U.S. Cl.
CPC ...
G06T 7/11 (2017.01); G06T 3/60 (2013.01); G06T 2207/20021 (2013.01); G06T 2207/20132 (2013.01);
Abstract

According to examples, a system for implementing image modification functions via use of variable scanning orders is described. The system may include a processor and a memory storing instructions. The processor, when executing the instructions, may cause the system to partition an image into a plurality of image blocks, identify one or more image blocks of the plurality of image blocks associated with a region of interest (ROI), and scan the one or more image blocks in an image modification order. The processor, when executing the instructions, may then arrange the one or more image blocks according to the image modification order to form a modified image including the region of interest (ROI) and crop the region of interest (ROI) in the modified image to form a new image.


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