The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 2025

Filed:

Mar. 23, 2022
Applicant:

Tencent Technology (Shenzhen) Company Limited, Shenzhen, CN;

Inventors:

De Cai, Shenzhen, CN;

Hu Ye, Shenzhen, CN;

Zhaoxuan Ma, Shenzhen, CN;

Xiao Han, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/11 (2017.01); G06V 10/80 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06T 7/11 (2017.01); G06V 10/809 (2022.01); G06T 2207/30024 (2013.01); G06T 2207/30242 (2013.01);
Abstract

Methods, apparatus, device, and storage medium for identifying an abnormal cell in a to-be-detected sample are disclosed. The method includes obtaining, by a device, multi-layer images of a to-be-detected sample, the to-be-detected sample comprising a single cell and a cell cluster; obtaining, by the device, multi-layer image blocks of the single cell and multi-layer image blocks of the cell cluster according to the multi-layer images; obtaining, by the device, a first identification result by a first image identification network according to the multi-layer image blocks of the single cell; obtaining, by the device, a second identification result by a second image identification network according to the multi-layer image blocks of the cell cluster; and determining, by the device, whether an abnormal cell exists in the to-be-detected sample according to the first identification result and the second identification result.


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