The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 2025

Filed:

Jan. 29, 2020
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Maho Fujihara, Tokyo, JP;

Daisuke Tateishi, Tokyo, JP;

Hideo Nakata, Tokyo, JP;

Shiho Adachi, Tokyo, JP;

Keisuke Sugihara, Tokyo, JP;

Shota Shimayoshi, Tokyo, JP;

Atsushi Takami, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); B61L 27/60 (2022.01); G06V 10/44 (2022.01); G06V 10/762 (2022.01); G06V 10/764 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); B61L 27/60 (2022.01); G06V 10/44 (2022.01); G06V 10/763 (2022.01); G06V 10/764 (2022.01); G06T 2200/24 (2013.01); G06T 2207/30121 (2013.01); G06V 2201/02 (2022.01);
Abstract

A test support method includes a step of obtaining a pre-change image and a post-change image to be displayed on a monitoring and control system, a step of extracting, from the post-change image, multiple symbols that have changed from corresponding symbols in the pre-change image, a step of adding order information to the multiple symbols extracted, and a step of outputting a test image in which the order information is added to the multiple symbols.


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