The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2025
Filed:
Jul. 26, 2019
Nec Corporation, Tokyo, JP;
Akira Tsuji, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
An inspection apparatus () includes: a three-dimensional sensor () configured to irradiate a member to be inspected with a beam and acquire point cloud data of the member to be inspected based on at least amplitude information of light; a direction identifying unit () configured to identify a predetermined direction in which there are the largest number of the point cloud data in the reference coordinate system which is coordinate axes for the member to be inspected; and a tilt amount determination unit () configured to determine a tilt amount for changing an arrangement of the reference coordinate system so that the number of the point cloud data in the predetermined direction increases in the eigen coordinate system which is coordinate axes for the three-dimensional sensor ().
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile