The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2025
Filed:
Aug. 26, 2020
Tsinghua University, Beijing, CN;
Tsinghua University, Beijing, CN;
Abstract
The present invention proposes a fabric defect detection method based on multi-modal deep learning. First, a tactile sensor is placed onto the fabric surface with different defects to collect the fabric texture images, a camera is used to collect the corresponding fabric external images, and a fabric external image and a fabric texture image constitute a set of fabric detection data; then, a feature extraction network and a multi-modal fusion network are connected to establish a classification model based on multi-modal deep learning, which uses the fabric texture image and fabric external image in each set of collected fabric detection data as input, and the fabric defect as output; said classification model is trained using the collected fabric detection data; finally, the trained classification model is used to detect the fabric defect. The present invention employs vision-touch complementary information, which can greatly improve the accuracy and robustness of detection.