The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2025
Filed:
Oct. 02, 2020
Element Ai Inc., Montreal, CA;
Negin Sokhandan Asl, Montreal, CA;
SERVICENOW CANADA INC., Montreal, CA;
Abstract
A system identifying anomalies in an image of an object is first trained using first sets of images corresponding to first anomaly types for the object. A model of the object is formed in a latent space. A label for each anomalous image is used to calculate vectors containing means and standard deviations for each first anomaly types. The means and standard deviations are used to calculate a log-likelihood loss for each first anomaly type. The system is retrained using second sets of images corresponding to second anomaly types for the object. The vectors are supplemented using labels for each second anomaly types. A statistically sufficient sample of information in the means and standard deviations vectors is supplied to the latent space. A log-likelihood loss for each of the first and second anomaly types is calculated based on their respective mean and standard deviation.