The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2025
Filed:
Jun. 14, 2021
Dell Products L.p., Round Rock, TX (US);
Sambasivarao Gaddam, South Grafton, MA (US);
Shivangi Geetanjali, Patna, IN;
Sowmya Kumar, Bangalore, IN;
Sweta Kumari, Bangalore, IN;
Shivangi Maharana, Cuttack, IN;
Sashibhusan Panda, Bengaluru, IN;
Shishir Kumar Parhi, Bangalore, IN;
Harikrishna Reyyi, Patha Agraharam, IN;
Baishali Roy, Bangalore, IN;
Seshadri Srinivasan, Shrewsbury, MA (US);
Antarlina Tripathy, Bangalore, IN;
Hung Dinh, Austin, TX (US);
Bijan Kumar Mohanty, Austin, TX (US);
Krishna Mohan Akkinapalli, Leander, TX (US);
Satish Ranjan Das, Round Rock, TX (US);
Shashikiran Rajagopal, Bangalore, IN;
Dell Products L.P., Round Rock, TX (US);
Abstract
A method comprises collecting data corresponding to a plurality of components in a system, wherein the data comprises information about at least one of respective protocols and respective interfaces associated with respective ones of the plurality of components. The data is analyzed to determine at least one of the respective protocols and the respective interfaces associated with the respective ones of the plurality of components. In the method, operations of one or more components of the plurality of components are tested based at least in part on the determination of the at least one of the respective protocols and the respective interfaces. The method further includes outputting respective statuses of the one or more components, wherein the respective statuses are derived at least in part from the testing.