The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 2025

Filed:

Apr. 24, 2020
Applicant:

Nec Corporation, Tokyo, JP;

Inventor:

Kentaro Sonoda, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 21/57 (2013.01);
U.S. Cl.
CPC ...
G06F 21/577 (2013.01); G06F 2221/034 (2013.01);
Abstract

In order to appropriately detect flaws in a structure related to security of a system related to at least one of software and hardware, a security inspection apparatus includes an obtaining unit that obtains one or more pieces of configuration information related to configuration of a system to be inspected in security inspection, the system being related to at least one of software and hardware, a determining unit that determines whether or not each of the one or more pieces of configuration information is associated with any of one or more types of security functions set as inspection items for the security inspection, and a generating unit that generates information related to the determination.


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