The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 2025

Filed:

Apr. 06, 2020
Applicant:

Nippon Telegraph and Telephone Corporation, Tokyo, JP;

Inventors:

Yu Adachi, Tokyo, JP;

Haruto Tanno, Tokyo, JP;

Hiroyuki Kirinuki, Tokyo, JP;

Yu Yoshimura, Tokyo, JP;

Toshiyuki Kurabayashi, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01); G06F 11/3664 (2013.01);
Abstract

An apparatus and a method relate to generating a test scenario for testing a web application. The disclosure includes executing a script that causes a transition of a screen to a reference screen of the web application. From the reference screen, the disclosure dynamically performs a screen transition analysis for subsequent screens that are transitioned from previous screens of the web application. The subsequent screens for the dynamically performing the screen transition analysis are within a boundary according to a predetermined number of hops from the reference screen. The screen transition analysis includes automatically generating a test scenario and input data for causing screen transitions in the web application. Based on the screen transitions, the screen transition analysis generates screen transition data diagram for testing the web application.


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