The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2025
Filed:
Jan. 10, 2023
Applicant:
Dell Products L.p., Round Rock, TX (US);
Inventors:
Jiacheng Ni, Shanghai, CN;
Spenser Sheng, Shanghai, CN;
Kay Shan, Shanghai, CN;
Stefanie Menghuan Chen, Shanghai, CN;
Assignee:
Dell Products, L.P., Round Rock, TX (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2018.01); G06F 11/36 (2006.01); G06F 17/18 (2006.01); G06N 3/0442 (2023.01);
U.S. Cl.
CPC ...
G06F 11/3664 (2013.01); G06F 11/3688 (2013.01); G06N 3/0442 (2023.01);
Abstract
Methods, system, and non-transitory processor-readable storage medium for bug fix system are provided herein. An example method includes executing at least one test on a system using an automated test tool. The bug fix system predicts at least one characteristic of a test related failure that occurred during the execution using test data produced by the automated test tool. The bug fix system predicts at least one source of the test related failure using the test data produced by the automated test tool.