The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2025
Filed:
Jul. 06, 2021
Ffei Limited, Hertfordshire, GB;
Martin Philip Gouch, Hertfordshire, GB;
VENTANA MEDICAL SYSTEMS, INC., Tuscon, AZ (US);
Abstract
A method is provided for operating a microscope scannercomprising a line scanner. Pre-scan data is generated for a targetcomprising a sample, wherein generating the pre-scan data comprises: obtaining a pre-scan image of the targetfrom a pre-scan; and identifying one or more sample-containing regionsand one or more sample-free regionsof the targetfrom the pre-scan image. An imaging scan is then performed of a scanning region of the targetincluding the one or more sample-containing regionsand the one or more sample-free regions. The scanning speed of the line scanneris adjusted along the image scan path based on the pre-scan data so that the targetis imaged at a higher scanning speed within the one or more sample-free regionsthan in the one or more sample-containing regions