The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2025
Filed:
Apr. 26, 2019
Arizona Board of Regents on Behalf of the University of Arizona, Tucson, AZ (US);
Yuzuru Takashima, Tucson, AZ (US);
Brandon Hellman, Tucson, AZ (US);
Joshua Rodriguez, Tucson, AZ (US);
ARIZONA BOARD OF REGENTS ON BEHALF OF THE UNIVERSITY OF ARIZONA, Tucson, AZ (US);
Abstract
A rotationally shift invariant and multi-layered array system for full-field of view and/or photon collection by 4 pi steradian field of view. In the system, all of the incoming light (i.e., light from all directions), in a solid angle of 4 pi steradians, is focused inside the optics. The optics have a spherically shift invariant structure, providing rotational shift invariance. The system comprises a nontraditional use of the Gabor Superlen and is a configuration of multiple microlens array shell structures with concentrically arranged bulk optical components. Examples of such bulk optical components include Luneburg lenses, micro-structured surfaces, a single lens, a plurality of single lenses, ball lenses, metalenses, diffractive optical elements, and magnetic lenses. In an embodiment, the Gabor Superlens (i.e., microlens array) is planar. In an embodiment, no moving parts are required for the system to achieve truly full-field of view imaging and/or photon collection by 4 pi steradian field of view.