The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2025
Filed:
Feb. 05, 2021
Hitachi Astemo, Ltd., Hitachinaka, JP;
Yasuo Shima, Hitachinaka, JP;
Keishi Komoriyama, Hitachinaka, JP;
Yoichiro Kobayashi, Hitachinaka, JP;
Hitachi Astemo, Ltd., Hitachinaka, JP;
Abstract
Poor opening is detected with certainty and reliability with respect to a ground line of an integrated circuit device regardless of the connection state of a load and the operating state of a drive circuit. In an integrated circuit device, a drive circuitswitches between conduction and interruption of a load current using switch elementsand. The ground lineis grounded via the GND terminalto the common ground provided outside the integrated circuit deviceand is connected to the drive circuit. The ground lineis grounded to the common ground via the GND terminaland is connected to the control circuit. The diagnostic current supply circuitsupplies a predetermined diagnostic current to the ground line. The rectifying elementsandare connected between the ground lineand the ground line. The diagnostic circuitmeasures the potential difference between the ground lineand the ground lineand compares the potential difference with the predetermined comparison voltageto diagnose the grounding state of the ground line