The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 2025

Filed:

Apr. 20, 2021
Applicant:

Point Engineering Co., Ltd., Chungcheongnam-do, KR;

Inventors:

Bum Mo Ahn, Gyeonggi-do, KR;

Seung Ho Park, Gyeonggi-do, KR;

Sung Hyun Byun, Gyeonggi-do, KR;

Assignee:

POINT ENGINEERING CO., LTD., Chungcheongnam-do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 1/073 (2006.01); G01R 1/067 (2006.01);
U.S. Cl.
CPC ...
G01R 1/07371 (2013.01); G01R 1/06755 (2013.01); G01R 1/07342 (2013.01);
Abstract

A probe head and a probe card having the same are provided. The probe head includes a plurality of guide plates each having a guide hole, wherein each of the guide plates has a shape in which a plurality of layers are stacked, and each of the guide plates includes: a first guide layer provided at a lowermost side thereof, and having a first guide hole; and a second guide layer provided at an uppermost side thereof, and having a second guide hole, wherein a side wall of the first guide hole and a side wall of the second guide hole are not provided on the same vertical line.


Find Patent Forward Citations

Ahn, Bum. (2025). Probe head and probe card having same (U.S. Patent No. 12222370). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12222370

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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