The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2025
Filed:
Jul. 19, 2022
Tsinghua University, Beijing, CN;
Fei Guo, Beijing, CN;
Ganlin Cheng, Beijing, CN;
Bingzhe Chen, Beijing, CN;
Chong Xiang, Beijing, CN;
Yijie Huang, Beijing, CN;
Shengshan Chen, Beijing, CN;
Yongjian Li, Beijing, CN;
Xiaohong Jia, Beijing, CN;
Yuming Wang, Beijing, CN;
TSINGHUA UNIVERSITY, Beijing, CN;
Abstract
A material testing machine, including a machine body, a first fixing element, a second fixing element and a detection assembly; the first and the second fixing elements are mounted to the machine body, the first fixing element is configured to mount a first testing element, and the second fixing element is configured to mount a second testing element; in a first state, the first and the second testing elements are in sliding contact; in a second state, the first fixing element drives the first testing element to collide with the second testing element; the detection assembly is configured to detect a target parameter, and in the first state, the target parameter includes a friction force and/or, a friction sound between the first and the second testing elements; and in the second state, the target parameter includes a collision force received by the first or the second testing element.