The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 2025

Filed:

Aug. 01, 2020
Applicant:

Hitachi Power Solutions Co., Ltd., Hitachi, JP;

Inventor:

Mutsumi Suzuki, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 29/11 (2006.01); G01N 29/22 (2006.01); G01N 29/265 (2006.01); G01N 29/44 (2006.01); G01N 29/46 (2006.01);
U.S. Cl.
CPC ...
G01N 29/11 (2013.01); G01N 29/221 (2013.01); G01N 29/265 (2013.01); G01N 29/4427 (2013.01); G01N 29/46 (2013.01); G01N 2291/015 (2013.01); G01N 2291/045 (2013.01); G01N 2291/102 (2013.01); G01N 2291/103 (2013.01);
Abstract

To improve defect detection accuracy, an ultrasonic inspection device causing an ultrasound beam to enter an object through a gas for inspection of the object includes: a transmission probe emitting the ultrasound beam; a reception probe mounted on an opposite side of the object from the transmission probe; and an eccentric distance adjuster that adjusts an eccentric distance between a transmission sound axis which is the central axis of the propagation path of the ultrasound beam transmitted from the transmission probe and a reception sound axis which is the central axis of the propagation path of an ultrasound beam assumed to be emitted from the reception probe to a distance greater than zero.


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