The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 2025

Filed:

Mar. 31, 2020
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Akira Tsuji, Tokyo, JP;

Junichi Abe, Tokyo, JP;

Taisuke Tanabe, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/88 (2006.01); G06T 7/13 (2017.01); G06V 10/60 (2022.01); G06V 10/764 (2022.01);
U.S. Cl.
CPC ...
G01N 21/8803 (2013.01); G06T 7/13 (2017.01); G06V 10/60 (2022.01); G06V 10/764 (2022.01);
Abstract

A detection device () according to the present disclosure includes an acquisition unit () that acquires point cloud data indicating a distance to an object and luminance information obtained from reflected light of a beam emitted when the point cloud data is measured, an edge detection unit () that performs edge detection based on the luminance information, a classification unit () that classifies, based on distribution of points contained in a crack candidate being a set of points detected as an edge, a plurality of the crack candidates into one of groups, and a label assignment unit () that accepts input of a label regarding the group from a user having visually recognized a shape of the crack candidate belonging to the group.


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