The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2025
Filed:
Jul. 16, 2021
Rochester Gauges, Llc, Dallas, TX (US);
Chester Roy Wildey, Euless, TX (US);
Rochester Sensors, LLC, Coppell, TX (US);
Abstract
In a Time Domain Reflectometry (TDR) measurement system including a measurement probe and an electronics assembly, a method for generating a time delay between transmit and receive pulses for capturing measurements in a given measurement cycle, comprising initiating first relatively slow and second relatively fast time-dependent non-linear ramped waveform functions associated with transmit and receive signals, respectively; and initiated at a time prior to initiation of the first time-dependent non-linear ramped waveform at a second time t; comparing outputs of the first and second time dependent non-linear ramped waveform functions and activating a receive signal to measure a data point along the waveguide at a third time twhen the outputs of the first and second time-dependent non-linear functions are equal; wherein the first and second time-dependent non-linear ramped functions are configured such that their waveform characteristics produces a time delay between time tand time tthat is a linear function of time.