The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 2025

Filed:

Dec. 20, 2019
Applicant:

Lg Chem, Ltd., Seoul, KR;

Inventors:

Jinyoung Lee, Daejeon, KR;

Sung Min Lee, Daejeon, KR;

Jeongkyu Lee, Daejeon, KR;

Hyojoon Lee, Daejeon, KR;

Seyoung Kim, Daejeon, KR;

Sung Ho Park, Daejeon, KR;

Seul Ki Im, Daejeon, KR;

Seok Hwan Kim, Daejeon, KR;

Daesik Hong, Daejeon, KR;

Assignee:

LG Chem, Ltd., Seoul, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C08F 210/16 (2006.01); C08F 210/18 (2006.01);
U.S. Cl.
CPC ...
C08F 210/16 (2013.01); C08F 210/18 (2013.01); C08F 2420/10 (2021.01);
Abstract

The present invention relates to polyolefin. More specifically, the present invention relates to polyolefin having excellent dart drop impact strength, and exhibiting improved transparency, and such polyolefin has a density of 0.915 g/cmto 0.930 g/cmmeasured according to ASTM D1505; and has an ethylene sequence inhomogeneity (I) calculated by the following Equation 1 of 1.25 to 1.40, when analyzed by SSA (Successive Self-nucleation and Annealing):Inhomogeneity ()=  [Equation 1]


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